Digital Instruments, VEECO 3100 AFM

INFORMATION: VEECO Dimension 3100 Atomic Force Microscope The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers. System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We accept Paypal, Company Check, Wire Transfers. TAXES & FEES: California Sales Tax applies if order within California at 8%. Handling charges may apply. Your cost is the price of your item, shipping/handling charge, insurance, and sales tax if applicable. REFUNDS & RETURNS: No returns after 14 days. Returns must have good reason for return, i.e. defective items, missing items, or items not described accurately. Returned items must be in same condition as shipped for refund. PLEASE Contact before leaving Negative Feedback in the seller review. Please Contact for any other specific heavy machinery or scientific instrument related inquiries, (have a database full of market contacts with varying industrial machinery and components, and can most likely get whatever you need). Please Message for all other Inquires, THANK YOU & HAVE A GOOD DAY! IF THERE ARE ANY PROBLEMS WITH THE ITEM DO NOT TRY TO REPAIR AND INVESTIGATE. CONTACT US IMMEDIATELY. WARRANTY IS NULL VOID IF ANY ITEM IS TAMPERED WITH, OPENED OR DISASSEMBLED. WE HAVE SEVERAL WAREHOUSES. Please check with us about ITEM'S AVAILABILITY prior to ordering. UPON RECEIPT OF YOUR PURCHASE PLEASE PHOTOGRAPH, DOCUMENT, AND SAVE ALL PACKAGING WHETHER DAMAGE IS VISIBLE OR NOT. ALL CLAIMS MUST BE REPORTED AND ACKNOWLEDGED WITHIN 72 HRS OF RECEIPT.